One Thing
Semiconductor Manufacturing
Senior/Engineer,MetrologyProcessDevelopment
Neural analysis suggests this role is
optimal for Senior candidates.
“Senior/Engineer, Metrology Process Development at One Thing. Skills: Metrology Process Development, CD Metrology, Semiconductor Manufacturing. Lead R&D, operation, sustainment of advanced CDSEM metrology. Focus on AFM, overlay/registration, X-ray metrology”
Industry & Context.
Root-cause analysis; Process issues diagnosis
What They're Looking For.
Must Have
2 years industry metrology experience, Process and equipment instrumentation, Semiconductor manufacturing processes understanding, Digital literacy including data science, AI and JMP understanding, BS + 5 years semiconductor experience
Nice to Have
MS/Ph.D. in Engineering, Physics, Material Science, 2+ years industry experience, Data analysis skills, High level of attention to detail, Ability to work as individual contributor, Ability to work in collaboration with a team, Excellent communication skills, Excellent organizational skills, Excellent interpersonal skills
What You'll Do.
sustainment of advanced CDSEM metrology
Focus on optical techniques
Develop CD metrology methods
Qualify CD metrology methods
Standardize CD metrology methods
Achieve best-in-class accuracy
Achieve best-in-class precision
Achieve best-in-class repeatability
Drive inline detection strategies
Enable rapid learning cycles
Perform detailed CD analysis
Perform detailed profile analysis
Perform detailed roughness analysis
Diagnose process issues
Ensure robust pattern fidelity
Partner with design teams
Partner with process teams
Partner with integration teams
Define metrology requirements
Define monitoring schemes
Support advanced patterning
Generate high-impact metrology reports
Provide clear data interpretation
Provide root-cause analysis
Provide actionable recommendations
Establish state-of-the-art CD metrology capabilities
Advance state-of-the-art CD metrology capabilities
Build deep technical capability
Build culture of metrology excellence
Build culture of continuous improvement
Influence supplier tool roadmaps
Influence supplier technology roadmaps
Unlock next-generation CD capabilities
Unlock next-generation patterning capabilities
How You'll Work.
Team & Collaboration
Process integration teams; Design teams; Integration teams
Communication Scope
Data interpretation; Root-cause analysis; Actionable recommendations
Full Job Description
**Our vision is to transform how the world uses information to enrich life for all.** Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity, sustainability, and giving back to our communities. Because doing so can fuel the very innovation we are pursuing. * Lead R&D, operation, and sustainment of advanced CDSEM metrology, with additional focus on AFM, overlay/registration, X‑ray metrology, and optical techniques. * Develop, qualify, and standardize CD metrology methods to achieve best‑in‑class accuracy, precision, and repeatability for advanced nodes. * Drive inline detection strategies in close collaboration with process and integration teams to enable rapid learning cycles. * Perform detailed CD, profile, and roughness analysis to diagnose process issues and ensure robust pattern fidelity. * Partner with design, process, and integration teams to define metrology requirements and monitoring schemes that support advanced patterning and scaling. * Generate high‑impact metrology reports with clear data interpretation, root‑cause analysis, and actionable recommendations. * Establish and advance state‑of‑the‑art CD metrology capabilities, including tool benchmarking, method innovation, and workflow optimization. * Mentor and coach engineers, building deep technical capability and a culture of metrology excellence and continuous improvement. * Influence supplier tool and technology roadmaps to unlock next‑generation CD and patterning capabilities aligned with Micron’s scaling strategy. **Required Skills:** * 2 years in industry metrology experience working with CDSEM (preferred), optical thin Films, overlay/registration, X-Ray, or AFM/wafer shape. * Process and equipment-related experience in instrumentation and calibratio
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